| Typicality: | 0.390 |
| Saliency: | 0.329 |
| of said | 4 | location |
| via the insulating layer | 4 | manner |
| electrode → be formed on → the semiconductor layer | 6 |
| electrode → be → a semiconductor device | 4 |
| electrode → be composed of → semiconductor | 3 |
| electrode → be formed on → the semiconductor chips | 3 |
| negative | neutral | positive |
| 0.047 | 0.893 | 0.060 |
| Raw frequency | 16 |
| Normalized frequency | 0.329 |
| Modifier score | 0.500 |
| Perplexity | 32.656 |