| Typicality: | 0.346 |
| Saliency: | 0.224 |
| with an ion beam | 2 | manner |
| ion → be implanted into → the silicon substrate | 5 |
| ion → be implanted into → si-containing substrate | 3 |
| negative | neutral | positive |
| 0.036 | 0.904 | 0.060 |
| Raw frequency | 8 |
| Normalized frequency | 0.224 |
| Modifier score | 0.500 |
| Perplexity | 141.597 |