Typicality: | 0.346 |
Saliency: | 0.224 |
with an ion beam | 2 | manner |
ion → be implanted into → the silicon substrate | 5 |
ion → be implanted into → si-containing substrate | 3 |
negative | neutral | positive |
0.036 | 0.904 | 0.060 |
Raw frequency | 8 |
Normalized frequency | 0.224 |
Modifier score | 0.500 |
Perplexity | 141.597 |