| Typicality: | 0.559 |
| Saliency: | 0.421 |
| respectively | 3 | manner |
| previously | 3 | temporal |
| on a philips x'pert pro diffractometer | 2 | location |
| structure → be investigated by → x-ray diffraction | 11 |
| structure → be characterized by → x-ray diffraction | 11 |
| structure → be studied by → x-ray diffraction | 7 |
| structure → be determined by → x-ray diffraction | 7 |
| structure → be confirmed by → x-ray diffraction | 5 |
| structure → be determined by → x-ray diffraction analysis | 4 |
| structure → be analyzed by → x-ray diffraction | 3 |
| negative | neutral | positive |
| 0.042 | 0.859 | 0.099 |
| Raw frequency | 48 |
| Normalized frequency | 0.421 |
| Modifier score | 0.900 |
| Perplexity | 23.484 |